Consider the following statements about early test design:

Posted by: Pdfprep Category: CTFL Tags: , ,

Consider the following statements about early test design:

i) Early test design can prevent fault multiplication

ii. Faults found during early test design are more expensive to fix

iii. Early test design can find faults

iv. Early test design can cause changes to the requirements

v) Early test design takes more effort
A . i, iii & iv are true. ii & v are false
B . iii is true, i, ii, iv & v are false
C . iii & iv are true. i, ii & v are false
D . i, iii, iv & v are true, ii us false
E . i & iii are true, ii, iv & v are false

Answer: A

Leave a Reply

Your email address will not be published.